Ключевые слова: HTS, YBCO, thin films, substrate SrTiO3, MOD process, fluorine-free process, co-evaporation process, coated conductors, MOCVD process, substrate Hastelloy, ion irradiation, irradiation effects, comparison, critical caracteristics, Jc/B curves, angular dependence, microstructure, experimental results
Nakamura T., Sohma M., Yamaguchi I., Kumagai T., Manabe T., Hirota N., Sato R., Tsuchiya T., Ebisawa T., Ohtsu H., Matsui H., Terao K., Kitada N.
Ключевые слова: HTS, YBCO, films large-area, MOD process, laser application, substrate sapphire, surface resistance, fabrication, experimental results
Ключевые слова: Hall effect, YBCO, films, substrate sapphire, MOD process, fabrication, surface, buffer layers, critical caracteristics, critical current density
Ключевые слова: HTS, YBCO, REBCO, films epitaxial, critical caracteristics, Jc/B curves, temperature dependence, pinning, co-evaporation process, MOD process, fluorine-free process, dislocations, microstructure, nanoscaled effects, angular dependence, experimental results, substrate single crystal, buffer layers
Sohma M., Yamaguchi I., Kondo W., Tsukada K., Kumagai T., Nakagawa Y., Manabe T., Kamiya K., Hikata T., Matsui H.
Ключевые слова: HTS, YBCO, fabrication, films thick, fluorine-free process, MOD process, substrate SrTiO3, buffer layers, solution techniques, microstructure
Ключевые слова: HTS, YBCO, MOD process, fluorine-free process, irradiation effects, fabrication, microstructure, films epitaxial, substrate SrTiO3, buffer layers
Sohma M., Yamaguchi I., Kondo W., Tsukada K., Kumagai T., Yamasaki H., Arai K., Manabe T., Matsui H.
Ключевые слова: HTS, YBCO, films, substrate sapphire, FCL resistive, protection layers, fabrication, experimental results, power equipment
Ключевые слова: HTS, YBCO, films, fluorine-free process, MOD process, substrate sapphire, substrate single crystal, defects, stacking fault, pinning, co-evaporation process, critical caracteristics, Jc/B curves, angular dependence, critical current density, microstructure, fabrication, experimental results
Higuchi N., Sohma M., Yamaguchi I., Kondo W., Kumagai T., Yamasaki H., Nakagawa Y., Kaiho K., Arai K., Matsui H., Natori N.
Ключевые слова: HTS, YBCO, films large-area, MOD process, substrate sapphire, FCL resistive, matrix, shunt, short circuit test, high voltage process, power equipment
Nakamura T., Sohma M., Yamaguchi I., Tsukada K., Kumagai T., Koyanagi K., Manabe T., Sato R., Tsuchiya T., Ebisawa T., Ohtsu H., Matsui H., Terao K.
Ключевые слова: HTS, YBCO, films, FCL resistive, shunt, normal zone propagation, overcurrent, temperature distribution, experimental results, power equipment
Ключевые слова: HTS, YBCO, buffer layers, substrate single crystal, MOD process, fluorine-free process, films epitaxial, microstructure, fabrication
Nakamura T., Sohma M., Yamaguchi I., Tsukada K., Kumagai T., Koyanagi K., Sato R., Tsuchiya T., Ebisawa T., Ohtsu H.
Sohma M., Kondo W., Tsukada K., Kumagai T., Manabe T., Kamiya K., Yamaguchi I.(i-yamaguchi@aist.go.jp)
Ключевые слова: HTS, YBCO, films epitaxial, buffer layers, MOD process, films large-area, substrate single crystal, microstructure, fabrication
Furuse M., Sohma M., Yamaguchi I., Kondo W., Kumagai T., Yamasaki H., Kaiho K., Arai K., Manabe T., Nakagawa M.
Ключевые слова: HTS, YBCO, films, substrate sapphire, MOD process, shunt, current limiting characteristics, experimental results, fabrication
Ключевые слова: HTS, YBCO, films epitaxial, buffer layers, MOD process, fluorine-free process, substrate single crystal, microstructure, fabrication
Sohma M., Yamaguchi I., Tsukada K., Kumagai T., Koyanagi K., Manabe T., Tsuchiya T., Ebisawa T., Ohtsu H.
Sohma M., Yamaguchi I., Tsukada K., Kumagai T., Koyanagi K., Manabe T., Tsuchiya T., Ebisawa T., Ohtsu H.
Ключевые слова: HTS, YBCO, films, substrate sapphire, buffer layers, fabrication, critical current density, critical caracteristics, MOD process, laser application
Yamaguchi I., Kondo W., Tsukada K., Mizuta S., Kumagai T., Sohma M.(m.sohma@aist.go.jp), Manabe T., Kamiya K.
Ключевые слова: HTS, YBCO, MOD process, films large-area, buffer layers, substrate single crystal, fabrication
Sohma M., Kondo W., Tsukada K., Mizuta S., Kumagai T., Manabe T., Kamiya K., Yamaguchi I.(i-yamaguchi@aist.go.jp)
Ключевые слова: HTS, YBCO, films epitaxial, substrate sapphire, buffer layers, MOD process, microstructure, fabrication
Ключевые слова: HTS, YBCO, films large-area, substrate sapphire, buffer layers, MOD process, critical current density, fabrication, critical caracteristics
Ключевые слова: HTS, YBCO, films large-area, substrate sapphire, buffer layers, MOD process, critical current, fabrication, critical caracteristics
Ключевые слова: HTS, YBCO, films epitaxial, substrate sapphire, buffer layers, MOD process, microstructure, critical current density, critical caracteristics, fabrication
Manabe T.(manabe.t@aist.go.jp), Sohma M., Yamaguchi I., Kondo W., Tsukada K., Mizuta S., Kumagai T.
Yamaguchi I., Kondo W., Tsukada K., Mizuta S., Kumagai T., Sohma M.(m.sohma@aist.go.jp), Manabe T.
Manabe T.(manabe.t@aist.go.jp), Sohma M., Yamaguchi I., Kondo W., Tsukada K., Mizuta S., Kumagai T.
© Copyright 2006-2012. Использование материалов сайта возможно только с обязательной ссылкой на сайт.
Свои замечания и пожелания вы можете направлять по адресу perst@isssph.kiae.ru
Техническая поддержка Alexey, дизайн Teodor.